Scanning Electron Microscopy Lab
“Automated Mineralogy Lab”
Building T – Room T 030
Tel: +49 30 838 70823
Contact: Dr. J. C. Vrijmoed
Email: j.c.vrijmoed@fu-berlin.de
The Zeiss Sigma 300 VP Field-Emission Scanning Electron Microscope is equipped with:
- Zeiss Gemini column
- 2 Bruker Quantax Xflash 60mm2 SDD EDS Detectors for quantitative Element Analysis
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1 Variable Pressure Secondary Electron detector (VPSE)
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1 High Definition Back Scatter Detector (HDBSE)
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1 Inlens Detector
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2 Zeiss ATLAS Correlative microscopy system (1 online/1 offline Workstation)
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2 Mineralogic Mining automated Mineralogy systems (1 online/1 offline Workstation)
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2 Reservoir Mining automated Pore analysis systems (1 online/1 offline Workstation)
Applications
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High-resolution automated surface imaging (Zeiss ATLAS)
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Surface morphology imaging of uncoated, unpolished samples (Low Vac)
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Automated quantitative Mineralogy- and Porosity mapping of thinsections
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Fast automated search of specific Mineral Phases (i.e. Sulfides, Zircons)
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Grain size/shape analysis and Mineral paragenesis analysis
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Cathodoluminescence analysis (with VPSE Detector)
The ZEISS Axio Imager M2m is optimized for automated transmitted/reflected light thinsection mapping. It is equipped with:
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4 Objectives 2.5x, 5x, 10x, and 20x (optimized for reflected light)
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Polarized transmitted light / motorized reflectors for polarized reflected light
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Motorized stage
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High Definition digital camera
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Zen Blue Software
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High performance PC for the analysis of GB-sized image data
Applications
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Fast full thinsection mapping for the correlation with SEM images and EDS data
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Fast thin section search for opaque phases like Sulfides, Oxides, etc.
